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ՌԵՆՏԳԵՆՅԱՆ ԴԻՖՐԱԿՏՈՄԵՏՐ

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EMPYREAN DIFFRACTOMETER Package Theta-Theta

Diffractometer cabinet (radiation enclosure) with electronics rack and system controller, equipped with wide doors for easy access to the diffractometer. Includes two 19" rack positions for additional electronics (e.g. non-ambient controllers). The cabinet complies to the world's most stringent regulations on X-ray, electrical and mechanical safety. The emission level is below 1 microSievert per hour on 10 cm distance, even with Mo or Ag X-ray tubes. The diffractometer cabinet is equipped with a 240 mm radius theta-theta goniometer and a source module for Empyrean X-ray tubes. Also included is data acquisition Data Collector software.

x-ray TUBE, EmPYREAN, Cu, LONG FINE FOCUS HR

This ceramic type tube has a copper anode and a long fine focal spot. The X-ray tube is designed for an enhanced stability of the focal spot for use with X-ray mirrors, hybrid and Johansson monchromators. It is equipped with one window for line focus and one for point focus. Maximum power is 1.8 kW

BETA FILTER Ni (FOR Cu RADIATION)

Ni filter for suppression of unwanted radiation, such as white radiation and Cu K-Beta radiation. To be used with Cu X-ray tubes. The intensity of the Cu K-Beta line is reduced to less than 1% of the Cu K-Alpha intensity.

SAXS/WAXS SAMPLE STAGE

The SAXS/WAXS stage is PreFIX mounted and is used to collect small angle X-ray scattering and/or wide angle X-ray scattering data on powders, liquids or solids. Sample holders for capillaries, powders, liquids and solids are sold separately.

CAPILLARY HOLDER 1 mm

This sample holder for 1mm capillaries is intended for use in a sample stage for pre-aligned capillary holders.

 

CAPILLARIES 1.0 mm QUARTZ

Set of 25 capillaries made of quartz glass to be used for x-ray diffraction experiments (also for high temperature) and for SAXS measurements, in combination with a 9430 064 30001 Capillary holder for 1 mm capillary. Outside diameter Ø = 1.0 mm, length=80 mm, wall thickness = 0.01 mm.

CAPILLARY EXCHANGE TOOL

This tool allows easy exchange of capillaries into a capillary holder.

CAPILLARY FILLING TOOL

This sample preparation tool is used for easy filling of liquids into capillaries placed in capillary holders.

SAXS ANTI SCATTER SLIT

This adjustable slit can be mounted onto the sample stage for pre-aligned capillary holders for optimized background reduction during small angle X-ray scattering experiments.

PREFIX INTERFACE MANUAL Z-ADJUSTMENT

PreFIX interface with manual z-adjustment for theta-theta goniometers. Provides mounting possibilities for various sample platforms. Maximum z-range 73 mm.

MANUAL XY-PLATFORM

 

Sample stage with manual x-y axes. Compatible with 9430 060 77001 PreFIX interface with manual z-adjustment or with 9430 060 92001 PreFIX interface with programmable z-adjustment. It allows manual positioning of the sample in x and y directions. Maximum sample mass: 2 kg. Maximum sample dimensions 95 mm x 95 mm x 51 mm (l x w x h). Positioning range 54 mm (-27 mm, +27 mm) for both axes.

 

DIAL GAUGE

The dial gauge for sample height adjustment and alignment fits on the PreFIX accessory position on the stage interface.

LEVELLING SAMPLE HOLDER, TABLE 80 mm

This sample holder is suitable for the Empyrean stages with Phi-X-Y capabilities, to be used with sample table of 80 mm for clamping solids and fragments.

PREFIX REFLECTION-TRANSMISSION SPINNER PLUS SPINNER CHANGER INTERFACE

PreFIX sample stage for sample spinning 9430 018 xxxx1 circular sample holders, with programmable phi-axis positioning or scanning. This stage can be used in reflection or transmission mode, and may be used in combination with the 9430 060 31001 sample changer. Also included is the sample spinner changer interface.The beam knife fits on the PreFIX accessory position on the stage interface. Range of adjustment: 0.5 mm - 5 mm above sample surface. The beam knife is used with linear detectors.

SAMPLE HOLDER BOTTOM, PW1800, SET OF 3

Set of bottom plates (3 pieces) for sample holder rings 9430 018 11271.

SAMPLE HOLDER TOP, 27 mm SET OF 3

The PANalytical 27mm Sample Insert, is a set of 3 holders used for the back-loading or front-loading of powder specimens, either manually or semi-automatically. This ring-shaped holder needs to be supported by the bottom plate, 9430 018 11001. The internal diameter of the ring is 27 mm and the thickness is 2.4 mm. Supports scans starting at 0° 2theta.

PREPARATION STATION, ROUND POWDER HOLDERS

The PANalytical Powder Sample Preparation Kit, is an aid for the back loading of powders into the 9430 018 11161 and the 9430 018 11271 sample holders. The 9430 017 70101 holds the sample holder ring firmly during loading. The kit is comprised of a sample preparation table (onto which the sample holder ring is clamped), a powder press block or piston, a dusting brush and a Stanley knife blade.

SAMPLE HOLDER, 32 mm, LOW ANGLE , SET OF 3

The PANalytical 32mm Low Angle Sample Holder, is a set of 3 sample holders for 32mm pellets, silicon plate, or the 9430 018 16321, ceramic filter plate. The maximum diameter of the sample on a filter plate is 29 mm, with a thickness of between 0.4 and 0.5mm. Supports scans starting at 0° 2theta.

Si SUBSTRATE, ZERO BACKGROUND 32 mm

(SET OF 2)

The PANalytical 32 mm Low background Insert, is a set of 2 silicon single crystal substrates, which are used for measurements of small amounts of sample material that require low background intensity. The diameter is 32 mm and the thickness is 2 mm. One side of the substrate is flat while the other side has a recess of 15mm diameter and 0.2 mm deep.

May be used with 9430 018 13321 or 9430 018 12001 sample holders.

TRANSMISSION HOLDER (SET OF 3)

Set of 3 sample holders for measurement of samples in transmission geometry. Accepts inserts of 6 mm thick and 40 mm diameter, such as the 9430 018 18251.This sample holder is designed for use with the 9430 030 76001 transmission spinner or reflection/transmission spinner 9430 030 64601.

INSERT TRANSMISSION (SET OF 3)

Set of 3 inserts for the analysis of samples in the transmission geometry. To be used with the 9430 018 18401 sample holder. These inserts can be used to clamp thin foils or fibers. The inner diameter of the ring is 25 mm, the maximum 2Theta angle in transmission geometry is 120° (when making a symmetrical scan with the transmission spinner sample stage 9430 030 76001.). To be used in the 9430 018 18401 sample holder and the 9430 030 76001 transmission spinner stage. Can also be used (in reflection geometry) in other sample stages that accept the range of 9430 018 xxxx sample holders.

TRANSMISSION INSERTS,  DISPOSABLE (SET OF 250)

Disposable transmission inserts for transmission sample holders (9430 018 18401). They are useful for air sensitive or hazardous materials or as an easy to use alternative to reusable inserts (set of 250).

TRANSPARENT FOILS (500X)

Box with 500 X-ray transparent foils, to be used with insert for air-sensitive sample holders (9430 018 15401), insert for transmission sample holders (9430 018 18251) or disposable inserts for transmission sample holders (9430 500 21511 or 9430 500 21521).  The foils are pre-cut in circular shape, and have a diameter of 63.5 mm. The material of the foils is polyimide (Kapton), the thickness is 7.5 µm.

FDS + FASS PACKAGE

PreFIX module with fixed divergence slit holder and fixed incident anti-scatter slit holder; includes set of fixed slits.

SOLLER SLIT 0.02 RADIAN

Soller slit 0.02 radians for incident and diffracted beam optics. Exchangeable with Soller slit 0.01 radians (9430 030 85101), 0.04 radians (9430 030 85401) or 0.08 radians (9430 030 85801). Reduce peak asymmetry at low angles.

PREFIX, PARABOLIC X-RAY MIRROR, Cu RADIATION,

Incident beam PreFIX module with X-ray mirror for Cu radiation for right goniometer systems. Includes 2 attenuator foils and a 1.4 mm slit. The multi-layer crystal converts a divergent beam projected by a line focus of an X-ray tube into a quasi-monochromatic and quasi-parallel beam of high intensity. White radiation and K-beta line are virtually eliminated. Divergence of the parallel beam is less than 0.055°. Beam dimensions are 1.3 mm x 20 mm with an extremely homogeneous output over the whole area.

ANTI-SCATTER SLIT FOR SPINNER – MIRROR

Antiscatter slit housing for the focusing mirror when used with the reflection transmission spinner stage.

BEAM MASK SET

Set of beam masks to reduce the beam width from X-ray mirror and hybrid monochromators. Beam mask dimensions: 20, 10, 4 and 2 mm.

FIXED SLITS, LOW ANGLE

A set of divergence slits of 1/8, 1/16 and 1/32° for low angle applications. The slits are designed to fit the divergence slit holders of the fixed divergence slit assembly 9430 030 82xxx, the X-ray mirror 9430 030 88xxx and the hybrid monochromators 9430 031 47xxx. Alternatively, they fit the rocking curve and triple axis diffracted beam optics (9430 030 97xxx and 9430 031 20xxx).

SMALL ANGLE SCATTER SLIT

Incident fixed slit for incident beam optic such as mirror, hybrid or focusing mirror to limit the size of the incident beam for small angle scattering experiments

PREFIX, PARALLEL PLATE COLLIMATOR, 0.27°

Diffracted beam PreFIX parallel plate collimator. The collimator is a set of parallel plates configured to limit the angular divergence of a diffracted x-ray beam to 0.27°. This has the effect of eliminating defocusing effects which occur during asymmetric diffraction experiments. A 0.1 mm slit for reflectivity measurements is included. May be combined with optional Soller slits 9430 030 85xxx and flat crystal diffracted beam monochromator 9430 031 21xxx.

Interface PIXcel FOR 0D APPlications USING Flat Graphite monochromator

Interface for mounting a PIXcel detector on the flat graphite monochromator for Cu radiation (9430 031 21001) which is attached to a PANalytical parallel plate collimator. With this interface, the detector is used in 0D mode.

MONOCHROMATOR, FLAT GRAPHITE

Diffracted beam monochromator with flat pyrolytic graphite crystal, adjustable for different wavelengths. To be used with PW3098 parallel plate collimator. It uses the X’Pert PRO PreFIX detector interfacing. The resulting optical path enables the collection of glancing angle data under very favorable peak-to-background conditions. Can be tuned to Cu, Co, Cr or Fe radiation.

PIXcel3D WITH PREFIX INTERFACE

Package includes a PIXcel3D detector  (9430 030 18301) and the PreFIX interface for  the PIXcel3D detector (9430 030 17001). The PIXcel3D all-purpose single chip detector can be used in static or scanning mode when used as area or line detector. 

Key benefits of the PIXcel3D include the very high dynamic range as

well as the ability to use this detector 0D, 1D, 2D and 3D modes. The PIXcel is  resulting from a collaboration between PANalytical and the Medipix3 consortium, a collaboration of  CERN (the European Organization for Nuclear Research) and various other leading research institutes across Europe.

Features:

·   256 x 256 pixel array,

·   552 µm pixel size,

·   99% count rate linearity to 98,000 cps per pixel or 25,000,000 cps per strip.

·   0D, scanning and static 1D functionality, scanning and static 2D functionality

·   and 3D Micro Computed Tomography functionality

·   Static 2theta range of 3.3° at standard 240 mm radius and 6° or 14.4° static 2theta range with optional radius reduction interfaces (9430 030 99651 and 9430 030 17901 respectively).

Please note that delivery of the PIXcel detector is subject to your confirmation of use thereof for x-ray analytical purposes with PANalytical XRD system only.  This item requires a description of use letter "For x-ray diffraction purposes" to be signed.

BOARD FOR 2 LINEAR DETECTORS

Electronics board for up to 2 linear detectors.

LARGE BETA FILTER Ni

Large diffracted beam Ni Beta filter for the PIXcel detector and for parallel plate collimators. For Cu radiation.

FIXED ANTI SCATTER SLITS PIXcel

Fixed Antiscatter slit assembly for the PIXcel detector. To be mounted on the PreFIX interface for PIXcel (9430 030 17001).  Includes slits (13.4, 11.2, 7.5 and 6 mm) and one alignment slit of 0.2 mm.

SOLLER SLIT LARGE 0.02 RADIAN

Soller slit 0.02 radians, large aperture for diffracted beam anti-scatter device for X'Celerator detector. Exchangeable with Soller slit large 0.04 radians (9430 030 85411).

REFLECTIVITY REFERENCE SAMPLE, Cr

The sample comprises of a thin chromium film on glass that is used to check the alignment of the 9430 034 98xxx parallel plate collimators.

VERIFICATION SAMPLES EasySAXS

Verification sample set for EasySAXS software.  Set includes three standard samples, TiO2 99.5%, TiO2 anatase / rutile mixture and ZnO each with particle sizes not exceeding 50nm.

DUAL NETWORK CARD

Dual Network Card, required in case of PiXcel3D (9430 030 18201).

AIR COMPRESSOR 220 V

220 V Air Compressor for pneumatic sample transport mechanism on Empyrean.  Compressed house air can be used in place of this stand alone air compressor.

HYFRA eCHILLY4 230 V, 50 Hz, 1 Ph

A specially designed refrigerated single pump cooling system (compressor) with an air cooled condenser. Suitable when running the X-ray systems at maximum 3.5kW in up to 35°C ambient air to 20°C. This is an indoor version. It operates at 230 Volt, 50 Hz, 1 phase.

X’PERT QUANTIFY SOFTWARE LICENSE

X’Pert Quantify provides hardware control for a broad range of PANalytical systems including X’Pert-MRD, X’Pert-PRO MRD, CubiX, CubiX-PRO, PW1800, PW1710 and PW3710.

Software for quantitative analysis based on individual reflections. The program provides to all currently accepted models including:

  • General
  • Straight Line
  • Matrix Flushing
  • Internal Standard
  • Single Line Addition
  • Dual Line Addition
  • Relative Intensity Ratio
  • Linear Multivariate Regression
  • (2) Thin Layer Correction Models

A broad range of correction methods is available to enable the net intensities of a reflection to be obtained with the highest degree of accuracy including overlap, monitor drift and background.

Contains 3 activations.

X’PERT QUANTIFY SOFTWARE LICENSE

(aDDITIONAL LICENCE)

Additional license to existing 9430 032 04921 licence.

HIGHSCORE LTU 1-3

Performs data treatments and XRD phase identification on various systems.

Allows installation of the software on one additional device. Data input and output is by files (all PANalytical and many competitor formats). This product requires a reference database for phase identification; options are the ICDD PDF2 or PDF4+/Minerals/Organics, the PAN-ICSD from PANalytical or the free COD (http://www.crystallography.net/new.html). Includes the following features:

·   Search-match algorithm uses peak and profile data

·   Auto-residue scoring

·   Advanced reporting functions

·   Graphics for examining, displaying, and editing diffractograms

·   Supports any number of user-defined reference databases

·   Includes batch feature for auto function of a sequence

·   Automation ready - can be launched from a command prompt

·   Similarity analysis of scans (cluster analysis up to 50 scans)

·   Referenced Intensity Ratio (RIR) for estimation of quantities of all identified phases

·   Percent crystallinity

·   Very fast profile fitting

·   Line profile analysis, microstructure analysis by profile fits

·   PLS partial least squares to determine/quantify one property directly from raw data

Windows XP Professional (32 bit) and Windows 7-8 Professional (32 bit and 64 bit) compliant

Contains 3 activations.

HIGHSCORE LTU

(aDDITIONAL LICENCE)

Performs data treatments and XRD phase identification on various systems.

Allows installation of the software on one additional device. Data input and output is by files (all PANalytical and many competitor formats). This product requires a reference database for phase identification; options are the ICDD PDF2 or PDF4+/Minerals/Organics, the PAN-ICSD from PANalytical or the free COD (http://www.crystallography.net/new.html). Includes the following features:

·   Search-match algorithm uses peak and profile data

·   Auto-residue scoring

·   Advanced reporting functions

·   Graphics for examining, displaying, and editing diffractograms

·   Supports any number of user-defined reference databases

·   Includes batch feature for auto function of a sequence

·   Automation ready - can be launched from a command prompt

·   Similarity analysis of scans (cluster analysis up to 50 scans)

·   Referenced Intensity Ratio (RIR) for estimation of quantities of all identified phases

·   Percent crystallinity

·   Very fast profile fitting

·   Line profile analysis, microstructure analysis by profile fits

·   PLS partial least squares to determine/quantify one property directly from raw data

Windows XP Professional (32 bit) and Windows 7-8 Professional (32 bit and 64 bit) compliant.

Plus option HighScore

The Plus option integrates all HighScore functionality with crystallography, structure fits (Rietveld, HKL-file quantitative, Pawley- and LeBail extraction) and microstructure analysis on data from various systems. Most of the tasks can be automated by user batches. A Rietveld analysis requires crystal structure data through CIF files or a crystal structure database; options are the ICDD PDF4+ orPDF4/Minerals, the PAN-ICSD from PANalytical or the free COD (http://www.crystallography.net/new.html). Additional features of the Plus option include:

·   Similarity analysis of scans (cluster analysis unlimited in no. of scans)

·   Preparing automated Rietveld analysis using RoboRiet

·   Unit cell indexing

·   Unit cell refinement

·   Space group testing and unit cell transformation

·   Structure reviewing, distances and angles calculations

·   Structure solution by charge-flipping (Superflip algorithm)

·   Line profile analysis, microstructure analysis by profile and structure fits

·   Mixed fits from structure-, HKL- and profile data

·   extended scripting in standard Pascal and building custom graphical user interfaces

Windows XP Professional(32 bit) and Windows 7-8 Professional (32 bit and 64 bit) compliant

ICSD DATABASE FOR HIGHSCORE 

Unique ICSD database to be used with HighScore or HighScore Plus version 3.0 or higher.  This database includes all of the phases in the ICSD database at the year of purchase and can be loaded on as many computers as HighScore Plus software is installed on. Unlike the standard ICSD database this PANalytical licensed version of the ICSD never expires.  However this database is not upgradeable from the purchased version to future versions of the ICSD database. 

The database is based on the latest release of the FIZ / NIST ICSD database and contains over 177,000 crystal structures.  PAN-ICSD is a search-match database as well and can be used in combination with HighScore (for search-match only) or with HighScore Plus (for search-match and for crystal structural retrieval).

The PAN-ICSD contains subfile information (User Inorganic, User Metallic, User Mineral, User Organic).

Contains 3 activations.

ICSD DATABASE FOR HIGHSCORE

(aDDITIONAL LICENCE)

Additional single activation license for an existing LTU (9430 032 13921) license.

PDF-2 DATABASE LICENSE, EDUCATIONAL, NEW USER

ICDD PDF-2 license for an educational institution includes database on DVD. PDF-2 Release 2013, the latest installment of the historic Powder Diffraction File, is designed for inorganic materials analyses using automated diffractometers. The database contains data from the ICDD experimental powder data collection and data collected, edited

and standardized from the NIST and ICSD databases. Many common organic materials from the ICDD are added to this database to facilitate rapid material identification.

Highlights:

·   265,127 total entries (233,700 inorganic & 37,816 organic)

·   110,224 experimental entries

·   144,604 entries calculated from ICSD

·   10,067 entries calculated from NIST

The license is valid on one single PC and remains valid for five years after registration at the ICDD headquarters. After 5 years, the license can be extended free of charge for 5 years in addition. Additional licenses for up to 10 PC's within the same site can be purchased at reduced cost. An overview of the terms and conditions can be found on http://www.icdd.com.

PDF-2 ADDITIONAL LICENSE EDUCATIONAL

Additional single license for PDF-2 educational master copy.

X’PERT REFLECTIVITY SOFTWARE LICENSE

X'Pert Reflectometry provides both simulation and automatic fitting of reflectometry data.  The X’Pert Reflectometry software uses the instrumental configuration, sample information and measurement parameters to provide fast and accurate results.  The PANalytical fitting procedures are: Segmented Fitting and Genetic Algorithm and a combination of both Genetic and Segmented fitting. 

The software also utilizes advanced error analysis and report templates for fast and easy publications. X’Pert Reflectometry includes the following features:

·   Genetic Fitting Algorithm

·   Segmented Fitting Algorithm

·   Combined Functionality of Genetic and Segmented Fitting

·   Graphics for examining, displaying, and editing reflectometry patterns

·  Error analysis

EasySAXS Software

EasySAXS is an advanced, user-friendly software package for the analysis of small-angle X-ray scattering (SAXS) data. It allows to deduce information on nanoscale structures and dimensions, nanoparticle shapes and surface areas.

EasySAXS offers a complete data analysis toolbox, automation options and reporting. The toolbox includes data reduction, Guinier and Porod analyses, p(r) function determination by indirect Fourier transformation,  least-squares fitting and model simulations. All parameter settings are conveniently accessible in the graphical user interface, allowing for efficient data analysis. Data can be exported in a format that is compatible with publicly available SAXS software packages that give access to extended analysis options.

Contains 3 activations.

EASYSAXS

(aDDITIONAL LICENCE)

Additional single activation license for an existing LTU (9430 032 20921) license.

MINITOWER PC

State-of-the-art minitower PC with 64-bit Microsoft Windows operating system.

23 INCH WIDESCREEN MONITOR

Dell Professional P2311H monitor or its -PANalytical selected- successor at the moment of shipment. 23 inch LED widescreen VGA,DVI-D (1.920 x 1.080) black

COLOR LASERJET

COLOR LASERJET PRINTER

CIP DELIVERY TO YEREVAN, ARMENIA

Delivery according to Incoterms 2010.

12 MONTH WARRANTY

Warranty as per Item 10 in PANalytical’s General Terms and Conditions. 

INSTALLATION ON SITE

Installation by a PANalytical-trained customer support engineer.

TRAINING ON SITE

On-site training.  5 working days.

Fluke թեստավորման սարքավորումներ

Fluke թեստավորման սարքավորումներ

  • Նշանակությունը`

Մալուխի անալիզատոր (Cable analyzer (tester) for copper cabling systems certification)- Սարքավորում /DSX-5000 INTL, 1 GHz DSX-5000 CableAnalyzer: Versiv Main & Remote + DSX Copper (2) Modules

Մալուխի անալիզատոր (Cable analyzer (tester) for copper cabling systems certification) - Դետալներ /DSX-CHA011S, DSX TERA  Cat 7A/Class FA Channel Set

Մանրաթելի սերտիֆիկացման հավաքածու (Fiber certification test kit) OFP-CFP-QI INTL, OptiFiber Pro & Quad CertiFiber Pro & Inspection Camera: Versiv Main & Remote + OptiFiber Pro Quad OTDR Module + Quad OLTS Modules (2) + Inspection Camera

Արևային մարտկոցների թեստավորման սարքավորում

Արևային մարտկոցների թեստավորման սարքավորում

  • Նշանակությունը`

Radiant Solar Cell Tester                                                                                                                                                                                          Չափիչ սարքը պետք է ապահովի հետևյալ պահանջները    

Լույսի ինտենսիվություն

100մՎտ/սմ²

Ճառագայթման անհավասարություն

< ±3%

Ճառագայթման անկայունություն

< ±3%

Թեստավորման հաստատունություն

< ±1%

Արդյունավետ թեստավորման Տարածք / Վտ

200մմ×200մմ / 0.1Վտ~5Վտ

Չափող լարում

0V~0.8V (թույլտվածք 1մՎ)

Չափող հոսանք

0mA~20A (թույլտվածք 1մԱ)

Թեստավորվող էլեկտրական բնութագրեր

Isc,Voc,Pmax,Vm,Im,FF,EFF,Temp,Rs,Rsh